Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317347 | Determining information for defects on wafers | Pavel Kolchin, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2019-06-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317347 | Determining information for defects on wafers | Pavel Kolchin, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2019-06-11 |