Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10338002 | Methods and systems for selecting recipe for defect inspection | Shuo Sun, Thomas B. Boatwright | 2019-07-02 |
| 10317347 | Determining information for defects on wafers | Stefano Palomba, Pavel Kolchin, Mikhail Haurylau, David W. Shortt | 2019-06-11 |
| 10249546 | Reverse decoration for defect detection amplification | Philip Measor, Paul MacDonald | 2019-04-02 |
| 10215713 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Pavel Kolchin, Mikhail Haurylau, Junwei Wei, Dan Kapp, Grace Hsiu-Ling Chen | 2019-02-26 |