Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10365617 | Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow | Shauh-Teh Juang | 2019-07-30 |
| 10192303 | Method and system for mixed mode wafer inspection | Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2019-01-29 |