Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10387608 | Metrology target identification, design and verification | Michael Adel, Tal Shusterman, Chen Dror | 2019-08-20 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2019-01-29 |