Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10395358 | High sensitivity repeater defect detection | Bjorn Brauer, Eugene Shifrin, Ashok Mathew, Lisheng Gao, Santosh Bhattacharyya +2 more | 2019-08-27 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong | 2019-01-29 |