Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Richard Wallingford, Chetana Bhaskar | 2019-01-29 |
| 10181185 | Image based specimen process control | Allen Park, Lisheng Gao, Ashok Kulkarni, Saibal Banerjee, Ping Gu +1 more | 2019-01-15 |