Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10402461 | Virtual inspection systems for process window characterization | Laurent Karsenti, Mark Wagner, Brian Duffy, Vijayakumar Ramachandran | 2019-09-03 |
| 10395356 | Generating simulated images from input images for semiconductor applications | Jing Zhang | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Scott A. Young, Mark J. Roulo, Jing Zhang, Laurent Karsenti, Mohan Mahadevan +1 more | 2019-07-23 |
| 10346740 | Systems and methods incorporating a neural network and a forward physical model for semiconductor applications | Jing Zhang | 2019-07-09 |
| 10186026 | Single image detection | Laurent Karsenti, John R. Jordan, Sankar Venkataraman, Yair Carmon | 2019-01-22 |
| 10181185 | Image based specimen process control | Allen Park, Lisheng Gao, Ashok Kulkarni, Saibal Banerjee, Ping Gu +1 more | 2019-01-15 |