Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10402461 | Virtual inspection systems for process window characterization | Kris Bhaskar, Mark Wagner, Brian Duffy, Vijayakumar Ramachandran | 2019-09-03 |
| 10395362 | Contour based defect detection | Ajay Gupta, Mohan Mahadevan, Sankar Venkataraman, Hedong Yang, Yair Carmon +2 more | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Scott A. Young, Mark J. Roulo, Jing Zhang, Mohan Mahadevan +1 more | 2019-07-23 |
| 10186026 | Single image detection | Kris Bhaskar, John R. Jordan, Sankar Venkataraman, Yair Carmon | 2019-01-22 |