Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10482590 | Method and system for defect classification | Li He, Chien-Huei Chen, John R. Jordan, Huajun Ying, Sinha Harsh | 2019-11-19 |
| 10395362 | Contour based defect detection | Ajay Gupta, Mohan Mahadevan, Hedong Yang, Laurent Karsenti, Yair Carmon +2 more | 2019-08-27 |
| 10186026 | Single image detection | Laurent Karsenti, Kris Bhaskar, John R. Jordan, Yair Carmon | 2019-01-22 |