Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10482590 | Method and system for defect classification | Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Huajun Ying, Sinha Harsh | 2019-11-19 |
| 10436720 | Adaptive automatic defect classification | Martin Plihal, Huajun Ying, Anadi Bhatia, Amitoz Singh Dandiana, Ramakanth Ramini | 2019-10-08 |