Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10482590 | Method and system for defect classification | Li He, Chien-Huei Chen, Sankar Venkataraman, Huajun Ying, Sinha Harsh | 2019-11-19 |
| 10186026 | Single image detection | Laurent Karsenti, Kris Bhaskar, Sankar Venkataraman, Yair Carmon | 2019-01-22 |