Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522376 | Multi-step image alignment method for large offset die-die inspection | Himanshu Vajaria, Yong Zhang | 2019-12-31 |
| 10483081 | Self directed metrology and pattern classification | Allen Park, Ajay Gupta | 2019-11-19 |
| 10410338 | Method and system for correlating optical images with scanning electron microscopy images | Hucheng Lee, Lisheng Gao, Yong Zhang | 2019-09-10 |