Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522376 | Multi-step image alignment method for large offset die-die inspection | Jan Lauber, Yong Zhang | 2019-12-31 |
| 10365639 | Feature selection and automated process window monitoring through outlier detection | Shabnam Ghadar, Sina Jahanbin, Bradley Ries | 2019-07-30 |
| 10290088 | Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput | Tommaso Torelli, Bradley Ries, Mohan Mahadevan | 2019-05-14 |