Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522376 | Multi-step image alignment method for large offset die-die inspection | Jan Lauber, Himanshu Vajaria | 2019-12-31 |
| 10410338 | Method and system for correlating optical images with scanning electron microscopy images | Hucheng Lee, Lisheng Gao, Jan Lauber | 2019-09-10 |
| 10402963 | Defect detection on transparent or translucent wafers | Xuguang Jiang, Yiwu Ding | 2019-09-03 |
| 10372113 | Method for defocus detection | Xuguang Jiang, Shifang Li | 2019-08-06 |