Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10473454 | Imaging-based height measurement based on known geometric information | — | 2019-11-12 |
| 10402963 | Defect detection on transparent or translucent wafers | Xuguang Jiang, Yong Zhang | 2019-09-03 |