Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Tao-Yi Fu, Lisheng Gao, Xuguang Jiang, Ping Gu, Sylvain Muckenhirn | 2019-06-18 |