Issued Patents 2018
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10132760 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Richard Wallingford, Grace Hsiu-Ling Chen, Markus Huber, Robert M. Danen | 2018-11-20 |
| 10127652 | Defect detection and classification based on attributes determined from a standard reference image | Avijit K. Ray-Chaudhuri, Raghav Babulnath, Kenong Wu | 2018-11-13 |
| 10012599 | Optical die to database inspection | Keith Wells, Xiaochun Li, Tao Luo, Markus Huber | 2018-07-03 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Thirupurasundari Jayaraman, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9915625 | Optical die to database inspection | Tao Luo, Keith Wells, Xiaochun Li | 2018-03-13 |
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Junqing Huang +2 more | 2018-01-30 |