Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10127652 | Defect detection and classification based on attributes determined from a standard reference image | Lisheng Gao, Avijit K. Ray-Chaudhuri, Raghav Babulnath | 2018-11-13 |