Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10127652 | Defect detection and classification based on attributes determined from a standard reference image | Lisheng Gao, Avijit K. Ray-Chaudhuri, Kenong Wu | 2018-11-13 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Lisheng Gao, Thirupurasundari Jayaraman, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9865512 | Dynamic design attributes for wafer inspection | Thirupurasundari Jayaraman | 2018-01-09 |