Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151706 | Inspection for specimens with extensive die to die process variation | Hucheng Lee, Bjorn Brauer | 2018-12-11 |
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Ashok Kulkarni, Saibal Banerjee, Bjorn Brauer | 2018-11-13 |
| 9996942 | Sub-pixel alignment of inspection to design | Pavan Kumar, Lisheng Gao, Thirupurasundari Jayaraman, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9965848 | Shape based grouping | Saibal Banerjee, Ashok Kulkarni, Jagdish Chandra Saraswatula | 2018-05-08 |