Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151706 | Inspection for specimens with extensive die to die process variation | Santosh Bhattacharyya, Hucheng Lee | 2018-12-11 |
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Ashok Kulkarni, Saibal Banerjee, Santosh Bhattacharyya | 2018-11-13 |
| 10115040 | Convolutional neural network-based mode selection and defect classification for image fusion | — | 2018-10-30 |