Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Ashok Kulkarni, Santosh Bhattacharyya, Bjorn Brauer | 2018-11-13 |
| 10074167 | Reducing registration and design vicinity induced noise for intra-die inspection | Ashok Kulkarni, Shaoyu Lu | 2018-09-11 |
| 9965848 | Shape based grouping | Ashok Kulkarni, Jagdish Chandra Saraswatula, Santosh Bhattacharyya | 2018-05-08 |