Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Lisheng Gao, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9865512 | Dynamic design attributes for wafer inspection | Raghav Babulnath | 2018-01-09 |