Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10132760 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Richard Wallingford, Lisheng Gao, Markus Huber, Robert M. Danen | 2018-11-20 |
| 10043261 | Generating simulated output for a specimen | Kris Bhaskar, Jing Zhang, Ashok Kulkarni, Laurent Karsenti | 2018-08-07 |
| 9976973 | Counting particles using an electrical differential counter | Nicholas Watkins, Rashid Bashir, William Rodriguez, Xuanhong Cheng, Mehmet Toner +1 more | 2018-05-22 |
| 9916965 | Hybrid inspectors | Kris Bhaskar, Keith Wells, Wayne McMillan, Jing Zhang, Scott A. Young +1 more | 2018-03-13 |