Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10132760 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Richard Wallingford, Lisheng Gao, Grace Hsiu-Ling Chen, Robert M. Danen | 2018-11-20 |
| 10012599 | Optical die to database inspection | Keith Wells, Xiaochun Li, Lisheng Gao, Tao Luo | 2018-07-03 |