Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2018-01-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2018-01-30 |