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Forming MOSFET structures with work function modification |
Ruqiang Bao, Gauri Karve, Derrick Liu, Gen Tsutsui, Reinaldo Vega +1 more |
2018-12-04 |
| 10128347 |
Gate-all-around field effect transistor having multiple threshold voltages |
Ruqiang Bao, Michael A. Guillorn, Terence B. Hook, Reinaldo Vega, Tenko Yamashita |
2018-11-13 |
| 10096607 |
Three-dimensional stacked junctionless channels for dense SRAM |
Michael A. Guillorn, Reinaldo Vega, Rajasekhar Venigalla |
2018-10-09 |
| 10056382 |
Modulating transistor performance |
Dechao Guo, Juntao Li, Sanjay C. Mehta, Huimei Zhou |
2018-08-21 |
| 10037895 |
Structures, methods and applications for electrical pulse anneal processes |
Michel J. Abou-Khalil, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Souvick Mitra +1 more |
2018-07-31 |
| 10032885 |
Channel replacement and bimodal doping scheme for bulk finFet threshold voltage modulation with reduced performance penalty |
Gauri Karve, Reinaldo Vega |
2018-07-24 |
| 9972550 |
Source/drain epitaxial electrical monitor |
Edward J. Nowak, Lyndon R. Logan |
2018-05-15 |
| 9941179 |
Capacitive measurements of divots in semiconductor devices |
Lyndon R. Logan, Edward J. Nowak, Yan He |
2018-04-10 |
| 9935106 |
Multi-finger devices in mutliple-gate-contacted-pitch, integrated structures |
Edward J. Nowak, Brent A. Anderson |
2018-04-03 |
| 9917196 |
Semiconductor device and method of forming the semiconductor device |
Marc A. Bergendahl, Gauri Karve, Fee Li Lie, Eric R. Miller, John R. Sporre +1 more |
2018-03-13 |
| 9911804 |
Vertical fin field effect transistor with air gap spacers |
Hari V. Mallela, Reinaldo Vega, Rajasekhar Venigalla |
2018-03-06 |
| 9881810 |
Structures, methods and applications for electrical pulse anneal processes |
Michel J. Abou-Khalil, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Souvick Mitra +1 more |
2018-01-30 |
| 9859384 |
Vertical field effect transistors with metallic source/drain regions |
Hari V. Mallela, Reinaldo Vega, Rajasekhar Venigalla |
2018-01-02 |
| 9859421 |
Vertical field effect transistor with subway etch replacement metal gate |
Reinaldo Vega, Rajasekhar Venigalla |
2018-01-02 |
