| 10147822 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2018-12-04 |
| 10096587 |
Fin-based diode structures with a realigned feature layout |
Mickey H. Yu, Alain Loiseau, Tsung-Che Tsai, You Li, Robert J. Gauthier, Jr. |
2018-10-09 |
| 10090400 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2018-10-02 |
| 10090301 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2018-10-02 |
| 10037895 |
Structures, methods and applications for electrical pulse anneal processes |
Michel J. Abou-Khalil, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam +1 more |
2018-07-31 |
| 10008491 |
Low capacitance electrostatic discharge (ESD) devices |
You Li, Robert J. Gauthier, Jr., Mickey H. Yu |
2018-06-26 |
| 9978874 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2018-05-22 |
| 9923096 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2018-03-20 |
| 9911852 |
Gate-all-around fin device |
John B. Campi, Jr., Robert J. Gauthier, Jr., Rahul Mishra, Mujahid Muhammad |
2018-03-06 |
| 9881810 |
Structures, methods and applications for electrical pulse anneal processes |
Michel J. Abou-Khalil, Robert J. Gauthier, Jr., Tom C. Lee, Junjun Li, Christopher S. Putnam +1 more |
2018-01-30 |
| 9869708 |
Integrated circuit protection during high-current ESD testing |
Shunhua T. Chang, James P. Di Sarro, Robert J. Gauthier, Jr., Nathan Jack |
2018-01-16 |
