CS

Chih-Tsung Shih

TSMC: 15 patents #79 of 2,832Top 3%
IT ITRI: 1 patents #208 of 880Top 25%
Overall (2017): #2,712 of 506,227Top 1%
16
Patents 2017

Issued Patents 2017

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
9823585 EUV focus monitoring systems and methods Chieh-Jen Cheng, Jeng-Horng Chen, Chia-Chen Chen, Shinn-Sheng Yu, Anthony Yen +1 more 2017-11-21
9786602 Interconnection structure and methods of fabrication the same Shih-Ming Chang 2017-10-10
9777321 Single molecule detection system and methods Chung-Fan Chiou, Ying-Chih Pu, Chao-Chi Pan, Ming-Chia Li, Chein-Shiu Kuo +2 more 2017-10-03
9766536 Mask with multilayer structure and manufacturing method by using the same Jeng-Horng Chen, Shinn-Sheng Yu, Anthony Yen 2017-09-19
9748133 Via definition scheme Yen-Cheng Lu, Shinn-Sheng Yu, Jeng-Horng Chen, Anthony Yen 2017-08-29
9726983 Method to define multiple layer patterns with a single exposure by charged particle beam lithography Yen-Cheng Lu, Jeng-Horng Chen, Shinn-Sheng Yu, Anthony Yen 2017-08-08
9728408 Method of semiconductor integrated circuit fabrication Chung-Ju Lee, Jeng-Horng Chen, Shinn-Sheng Yu, Tsung-Min Huang, Anthony Yen 2017-08-08
9709884 EUV mask and manufacturing method by using the same Shinn-Sheng Yu, Jeng-Horng Chen, Anthony Yen 2017-07-18
9685367 Photomask for forming multiple layer patterns with a single exposure Yen-Cheng Lu, Shinn-Sheng Yu, Jeng-Horng Chen, Anthony Yen 2017-06-20
9679803 Method for forming different patterns in a semiconductor structure using a single mask Tsung-Min Huang, Chung-Ju Lee, Yen-Cheng Lu 2017-06-13
9664999 Method of making an extreme ultraviolet pellicle Tien-Hsi Lee, Chia-Jen Chen, Shang-Chieh Chien, Shinn-Sheng Yu, Jeng-Horng Chen +1 more 2017-05-30
9612523 Structure and method for reflective-type mask Chi-Lun Lu, Jeng-Horng Chen, Chia-Chen Chen, Shinn-Sheng Yu, Anthony Yen +1 more 2017-04-04
9588417 Photomask pellicle Chia-Chun Chung, Chia-Hao Hsu 2017-03-07
9588419 Extreme ultraviolet light (EUV) photomasks and fabrication methods thereof Yen-Cheng Lu, Shinn-Sheng Yu, Jeng-Horng Chen, Anthony Yen 2017-03-07
9557649 Assist feature for a photolithographic process Tao Huang, Chia-Jen Chen, Hsin-Chang Lee, Shinn-Sheng Yu, Jeng-Horng Chen +1 more 2017-01-31
9535316 Photomask with three states for forming multiple layer patterns with a single exposure Yen-Cheng Lu, Shinn-Sheng Yu, Jeng-Horng Chen, Anthony Yen 2017-01-03