Issued Patents 2003
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6657221 | Image classification method, observation method, and apparatus thereof with different stage moving velocities | Ryo Nakagaki, Yuji Takagi, Takashi Hiroi, Minori Noguchi, Kazuo Aoki | 2003-12-02 |
| 6613593 | Method of fabricating a semiconductor device | Maki Tanaka, Kenji Watanabe, Mari Nozoe, Hiroshi Miyai | 2003-09-02 |
| 6614923 | Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof | Chie Shishido, Yuji Takagi, Shuji Maeda, Takanori Ninomiya, Takashi Hiroi +1 more | 2003-09-02 |
| 6614022 | Pattern inspection method and apparatus using electron beam | Takashi Hiroi, Asahiro Kuni, Chie Shishido, Hiroyuki Shinada, Yasuhiro Gunji +1 more | 2003-09-02 |
| 6607041 | Power tools | Hitoshi Suzuki | 2003-08-19 |
| 6598684 | Impact power tools | — | 2003-07-29 |
| 6595769 | Combustion burner and mixer for combustion burner | — | 2003-07-22 |
| 6580183 | Electric circuit shielding | Kazuo Kato | 2003-06-17 |
| 6559459 | Convergent charged particle beam apparatus and inspection method using same | Maki Tanaka, Takashi Hiroi, Hiroyuki Shinada, Taku Ninomiya | 2003-05-06 |