Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6657221 | Image classification method, observation method, and apparatus thereof with different stage moving velocities | Ryo Nakagaki, Takashi Hiroi, Masahiro Watanabe, Minori Noguchi, Kazuo Aoki | 2003-12-02 |
| 6622054 | Method monitoring a quality of electronic circuits and its manufacturing condition and system for it | Hirohito Okuda, Toshifumi Honda, Hisae Yamamura, Hideaki Doi, Shigeshi Yoshinaga | 2003-09-16 |
| 6614923 | Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof | Chie Shishido, Shuji Maeda, Takanori Ninomiya, Takashi Hiroi, Masahiro Watanabe +1 more | 2003-09-02 |
| 6587581 | Visual inspection method and apparatus therefor | Yukio Matsuyama, Takashi Hiroi, Maki Tanaka, Asahiro Kuni, Junzou Azuma +2 more | 2003-07-01 |
| 6567350 | Method for adjusting control operation in an optical disc recording device | Keiichi Kawashima, Hiroshi Sugimoto, Hirofumi Ide, Kenzo Ishibashi | 2003-05-20 |
| 6553323 | Method and its apparatus for inspecting a specimen | Kenji Obara, Toshifumi Honda, Ryo Nakagaki, Toshiei Kurosaki, Yasuhiko Ozawa | 2003-04-22 |
| 6549499 | Recording defect substitution method for a disc-shaped recording medium, and a recording and reproducing apparatus for a disc-shaped recording medium | Takahiro Nagai, Yoshihisa Fukushima, Shunji Ohara, Isao Satoh | 2003-04-15 |
| 6546308 | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Hideaki Doi, Makoto Ono | 2003-04-08 |