Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6622054 | Method monitoring a quality of electronic circuits and its manufacturing condition and system for it | Hirohito Okuda, Hisae Yamamura, Yuji Takagi, Hideaki Doi, Shigeshi Yoshinaga | 2003-09-16 |
| 6553323 | Method and its apparatus for inspecting a specimen | Kenji Obara, Yuji Takagi, Ryo Nakagaki, Toshiei Kurosaki, Yasuhiko Ozawa | 2003-04-22 |