Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6614022 | Pattern inspection method and apparatus using electron beam | Takashi Hiroi, Asahiro Kuni, Masahiro Watanabe, Chie Shishido, Hiroyuki Shinada +1 more | 2003-09-02 |
| 6605718 | Method for reducing organic solvents remaining in tris-(2,3-epoxypropyl)-isocyanurate crystals | Hisao Ikeda, Motohiko Hidaka | 2003-08-12 |