Issued Patents All Time
Showing 26–47 of 47 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8183546 | Ion implantation through laser fields | — | 2012-05-22 |
| 8153496 | Self-aligned process and method for fabrication of high efficiency solar cells | — | 2012-04-10 |
| 8148237 | Pressurized treatment of substrates to enhance cleaving process | Julian G. Blake | 2012-04-03 |
| 7910477 | Etch residue reduction by ash methodology | Jeannette Michelle Jacques | 2011-03-22 |
| 7902091 | Cleaving of substrates | — | 2011-03-08 |
| 7868306 | Thermal modulation of implant process | — | 2011-01-11 |
| 7772867 | Structures for testing and locating defects in integrated circuits | Richard L. Guldi, Toan Tran | 2010-08-10 |
| 7767583 | Method to improve uniformity of chemical mechanical polishing planarization | Thirumal Thanigaivelan | 2010-08-03 |
| 7745238 | Monitoring of temperature variation across wafers during processing | Rosa A. Orozco-Teran, Laura M. Matz | 2010-06-29 |
| 7601629 | Semiconductive device fabricated using subliming materials to form interlevel dielectrics | Richard L. Guldi, Asad Haider, Frank Poag | 2009-10-13 |
| 7443189 | Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit | — | 2008-10-28 |
| 7312151 | System for ultraviolet atmospheric seed layer remediation | Aaron Frank, David Gonzalez, John DeGenova, Srinavas Raghavan | 2007-12-25 |
| 7268073 | Post-polish treatment for inhibiting copper corrosion | Mona Eissa, Christopher Lyle Borst, Ting Tsui | 2007-09-11 |
| 7228193 | Methods for detecting structure dependent process defects | Richard L. Guldi, Jae Hyun Park | 2007-06-05 |
| 7200498 | System for remediating cross contamination in semiconductor manufacturing processes | — | 2007-04-03 |
| 7112540 | Pretreatment for an electroplating process and an electroplating process in including the pretreatment | Richard L. Guldi | 2006-09-26 |
| 7015568 | System for ultraviolet atmospheric seed layer remediation | Aaron Frank, David Gonzalez, John DeGenova, Srinavas Raghavan | 2006-03-21 |
| 6963206 | System and method of evaluating gate oxide integrity for semiconductor microchips | — | 2005-11-08 |
| 6869873 | Copper silicide passivation for improved reliability | Robert W. Bradshaw, Daniele Gilkes, Sailesh Mansinh Merchant, Kurt G. Steiner | 2005-03-22 |
| 6812050 | System and method of evaluating gate oxide integrity for semiconductor microchips | — | 2004-11-02 |
| 6607927 | Method and apparatus for monitoring in-line copper contamination | Damon K. DeBusk | 2003-08-19 |
| 6573183 | Method and apparatus for controlling contamination during the electroplating deposition of metals onto a semiconductor wafer surface | Sailesh Mansinh Merchant, Minseok Oh | 2003-06-03 |