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USPTO Patent Rankings Data through Dec 31, 2025
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Andrej Mitrovic — 33 Patents

UNUnknown: 1 patents #29,356 of 83,584Top 40%
Phoenix, AZ: #144 of 6,660 inventorsTop 3%
Arizona: #848 of 32,909 inventorsTop 3%
Overall (All Time): #105,480 of 4,157,543Top 3%
33 Patents All Time
Andrej Mitrovic has been granted 33 US patents while listed as an inventor at Unknown. The first was granted in 2004 and the most recent in December 2024. Andrej Mitrovic ranks #105,480 of 4,157,543 US inventors in our database (top 2.5%). Patent records list Andrej Mitrovic in Phoenix, AZ, US.

Issued Patents All Time

Showing 1–25 of 33 patents

Patent #TitleCo-InventorsDate
12158374 Time-resolved OES data collection Sergey Voronin, Blaze Messer, Yan Chen, Joel Ng, Ashawaraya Shalini +2 more 2024-12-03
8296687 System and method for using first-principles simulation to analyze a process performed by a semiconductor processing tool Eric J. Strang 2012-10-23
8073667 System and method for using first-principles simulation to control a semiconductor manufacturing process Eric J. Strang 2011-12-06
8050900 System and method for using first-principles simulation to provide virtual sensors that facilitate a semiconductor manufacturing process Eric J. Strang 2011-11-01
8036869 System and method for using first-principles simulation to control a semiconductor manufacturing process via a simulation result or a derived empirical model Eric J. Strang 2011-10-11
8032348 System and method for using first-principles simulation to facilitate a semiconductor manufacturing process Eric J. Strang 2011-10-04
8014991 System and method for using first-principles simulation to characterize a semiconductor manufacturing process Eric J. Strang 2011-09-06
7789963 Chuck pedestal shield Steven Fink 2010-09-07
7591923 Apparatus and method for use of optical system with a plasma processing system Audunn Ludviksson 2009-09-22
7353141 Method and system for monitoring component consumption Eric J. Strang 2008-04-01
7241397 Honeycomb optical window deposition shield and method for a plasma processing system Steven Fink, Paula Calabrese 2007-07-10
7233878 Method and system for monitoring component consumption Eric J. Strang 2007-06-19
7208067 Method and system for monitoring RF impedance to determine conditions of a wafer on an electrostatic chuck 2007-04-24
7186313 Plasma chamber wall segment temperature control Maolin Long, Paul Moroz, Steven Fink, William Jones 2007-03-06
7164236 Method and apparatus for improved plasma processing uniformity Eric J. Strang, Murray D. Sirkis, Bill Quon, Richard Parsons, Yuji Tsukamoto 2007-01-16
7109788 Apparatus and method of improving impedance matching between an RF signal and a multi- segmented electrode Jovan Jevtic 2006-09-19
7073383 Apparatus and method for determining clamping status of semiconductor wafer William Jones, Paul Moroz 2006-07-11
7075031 Method of and structure for controlling electrode temperature Eric J. Strang, Jim Fordemwalt, Wayne Johnson 2006-07-11
7020583 Method and apparatus for determining chemistry of part's residual contamination Paula Calabrese 2006-03-28
7015414 Method and apparatus for determining plasma impedance 2006-03-21
6965287 Low reflection microwave window 2005-11-15
6962664 Controlled method for segmented electrode apparatus and method for plasma processing 2005-11-08
6958484 Method and apparatus for 2-d spatially resolved optical emission and absorption spectroscopy 2005-10-25
6917204 Addition of power at selected harmonics of plasma processor drive frequency Jovan Jevtic, Richard Parsons, Murray D. Sirkis 2005-07-12
6899527 Closed-drift hall effect plasma vacuum pump for process reactors Bill Quon, Samuel Antley 2005-05-31