Issued Patents All Time
Showing 26–46 of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6777967 | Inspection method and inspection apparatus | Kiyoshi Takekoshi, Tadatomo Suga, Toshihiro Itoh, Kenichi Kataoka | 2004-08-17 |
| 6747467 | Assembly apparatus and method of contactor | — | 2004-06-08 |
| 6747465 | Contractor, method for manufacturing the same, and probe card using the same | Masayoshi Esashi, Tomohisa Hoshino | 2004-06-08 |
| 6634245 | Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism | Haruhiko Yoshioka, Yutaka Akaike, Masaru Suzuki | 2003-10-21 |
| 6590381 | Contactor holding mechanism and automatic change mechanism for contactor | Junichi Hagihara, Kiyoshi Takekoshi | 2003-07-08 |
| 6545493 | High-speed probing apparatus | — | 2003-04-08 |
| 6380753 | Screening method of semiconductor device and apparatus thereof | Itaru Iida | 2002-04-30 |
| 6344752 | Contactor and production method for contractor | Junichi Hagihara | 2002-02-05 |
| 6140828 | Prober and probe method | Haruhiko Yoshioka | 2000-10-31 |
| 6130543 | Inspection method and apparatus for semiconductor integrated circuit, and vacuum contactor mechanism | — | 2000-10-10 |
| 6075373 | Inspection device for inspecting a semiconductor wafer | — | 2000-06-13 |
| 5844199 | Conductor pattern check apparatus for locating and repairing short and open circuits | Takashi Amemiya | 1998-12-01 |
| 5825500 | Unit for transferring to-be-inspected object to inspection position | Noboru Hayakawa | 1998-10-20 |
| 5742173 | Method and apparatus for probe testing substrate | Yoichi NAKAGOMI, Hidehito Yokomori, Satoshi Sano | 1998-04-21 |
| 5691764 | Apparatus for examining target objects such as LCD panels | Kiyoshi Takekoshi, Itaru Iida | 1997-11-25 |
| 5639390 | Conductor pattern check apparatus for locating and repairing open circuits | Takashi Amemiya | 1997-06-17 |
| 5568054 | Probe apparatus having burn-in test function | Itaru Iida | 1996-10-22 |
| 5412329 | Probe card | Tamio Kubota, Keiichi Yokota | 1995-05-02 |
| 4959104 | Self-hardenable material | Minoru Oshima, Shinya Kitoh, Toshiaki Kobayashi | 1990-09-25 |
| 4542001 | Fine particulate crystalline aluminum orthophosphate and method for preparing same | Kensaku Maruyama, Motoi Takenaga, Kazuhiko Muramoto, Mitsutomo Tsuhako | 1985-09-17 |
| 4481175 | Process for preparing apatite | Akihiko Nakamura, Kensaku Maruyama, Kohji Nakamura | 1984-11-06 |