Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5801764 | Monitor device and monitor method | Hiroto Koizumi | 1998-09-01 |
| 5742173 | Method and apparatus for probe testing substrate | Yoichi NAKAGOMI, Shinji Iino, Satoshi Sano | 1998-04-21 |