NM

Naoki Matsumoto

TL Tokyo Electron Limited: 74 patents #23 of 5,567Top 1%
Sumitomo Electric Industries: 39 patents #287 of 21,551Top 2%
AD Advantest: 12 patents #65 of 1,193Top 6%
OC Omron Healthcare Co.: 10 patents #69 of 475Top 15%
NC Nippondenso Co.: 7 patents #296 of 3,479Top 9%
Honda Motor Co.: 7 patents #3,151 of 21,052Top 15%
TO Tosoh: 7 patents #69 of 1,042Top 7%
HE Hitachi Kokusai Electric: 6 patents #150 of 843Top 20%
DE Denso: 6 patents #2,220 of 11,792Top 20%
OL Olympus: 4 patents #1,098 of 3,097Top 40%
OM Omron: 4 patents #761 of 3,089Top 25%
ME Mercian: 4 patents #14 of 110Top 15%
AE Amano Enzyme: 4 patents #12 of 118Top 15%
SO Sony: 4 patents #8,966 of 25,231Top 40%
OI Olympus Imaging: 3 patents #113 of 341Top 35%
ZK Zaidan Hojin Biseibutsu Kagaku Kenkyu Kai: 3 patents #43 of 194Top 25%
ND Ntt Docomo: 3 patents #619 of 1,706Top 40%
Rohm Co.: 3 patents #810 of 2,292Top 40%
SU Subaru: 3 patents #330 of 1,684Top 20%
SI Sumitomo Metal Industries: 3 patents #222 of 1,462Top 20%
AC Asmo Co.: 2 patents #218 of 745Top 30%
FC Futaba Industrial Co.: 2 patents #37 of 167Top 25%
JT Jtekt: 2 patents #749 of 1,969Top 40%
SP Sakai Display Products: 2 patents #82 of 175Top 50%
KT Kabushiki Kaisha Toshiba: 2 patents #9,982 of 21,451Top 50%
Fujitsu Limited: 2 patents #10,930 of 24,456Top 45%
KI Kurita Water Industries: 1 patents #167 of 384Top 45%
Mitsubishi Electric: 1 patents #15,491 of 25,717Top 65%
OC Olympus Optical Co.: 1 patents #1,517 of 2,334Top 65%
KE Kokusai Electric: 1 patents #344 of 583Top 60%
BU Buffalo: 1 patents #42 of 80Top 55%
MC Murata Manufacturing Co.: 1 patents #3,462 of 5,295Top 70%
NO Nok: 1 patents #382 of 725Top 55%
Overall (All Time): #2,813 of 4,157,543Top 1%
216
Patents All Time

Issued Patents All Time

Showing 151–175 of 216 patents

Patent #TitleCo-InventorsDate
7589000 Fabrication method and fabrication apparatus of group III nitride crystal substance Hitoshi Kasai, Takuji Okahisa, Shunsuke Fujita, Hideyuki Ijiri, Fumitaka Sato +4 more 2009-09-15
7584714 Method and system for improving coupling between a surface wave plasma source and a plasma space Lee Chen, Caiz Hong Tian 2009-09-08
7587134 Camera having barrier Hidenobu Mochinushi, Kosaku Nishio, Moriya Katagiri, Satoru Yasutomi, Nobuyuki Tanaka +1 more 2009-09-08
7582182 Method and apparatus for measuring electron density of plasma and plasma processing apparatus Yohei Yamazawa, Chishio Koshimizu, Tatsuo Matsudo, Sumie Segawa 2009-09-01
7573639 Terahertz-band optical filter, designing method thereof, and manufacturing method thereof 2009-08-11
7538582 Driver circuit, test apparatus and adjusting method Takashi Sekino, Toshiaki Awaji 2009-05-26
7535082 Nitride semiconductor wafer and method of processing nitride semiconductor wafer Masahiro Nakayama, Koshi Tamamura, Masao Ikeda 2009-05-19
7528637 Driver circuit Takashi Sekino 2009-05-05
7521339 GaN single crystal substrate and method of making the same Kensaku Motoki, Takuji Okahisa 2009-04-21
7504323 GaN single crystal substrate and method of making the same Kensaku Motoki, Takuji Okahisa 2009-03-17
7482490 Amine compound having fluorene group as framework, process for producing the amine compound, and use of the amine compound Masakazu Nishiyama, Hisao Eguchi 2009-01-27
7464702 Method of producing III-nitride substrate 2008-12-16
7462293 Method and apparatus for measuring electron density of plasma and plasma processing apparatus Yohei Yamazawa, Chishio Koshimizu 2008-12-09
7454522 Connection management apparatus for network devices 2008-11-18
7452814 Method of polishing GaN substrate 2008-11-18
7446045 Method of manufacturing nitride substrate for semiconductors 2008-11-04
7446962 Camera Hitoshi Yoshida 2008-11-04
7426338 Switch mechanism usable underwater Ikko Mori, Tsuyoshi Hirabayashi 2008-09-16
7411273 Nitride semiconductor substrate 2008-08-12
7398055 Electronic device and program Koji Tajima, Hiroaki Ban, Kazuhiro Yamada 2008-07-08
7357837 GaN single crystal substrate and method of making the same Kensaku Motoki, Takuji Okahisa 2008-04-15
7355432 Buffer circuit, driver circuit, and semiconductor testing apparatus 2008-04-08
7339656 Method and apparatus for measuring electron density of plasma and plasma processing apparatus Yohei Yamazawa, Chishio Koshimizu, Tatsuo Matsudo, Sumie Segawa 2008-03-04
7321470 Camera Hitoshi Yoshida, Akira Futami, Toshifumi Nakano, Tsuyoshi Kawai 2008-01-22
7247729 Method for producing pipecolamide derivative Toshio Tsuchida, Katsura Kaneko 2007-07-24