PC

Peijun Chen

TI Texas Instruments: 13 patents #1,059 of 12,488Top 9%
AB Asm Ip Holding B.V.: 3 patents #237 of 620Top 40%
IV Interuniversitair Micro-Electronica Centrum Vzw: 1 patents #167 of 450Top 40%
AA Asm America: 1 patents #116 of 181Top 65%
ZL Zhejiang Lab: 1 patents #117 of 308Top 40%
GE: 1 patents #19,878 of 36,430Top 55%
UP University Of Pittsburgh: 1 patents #882 of 1,817Top 50%
BL Beijing Qihoo Techology Company Limited: 1 patents #96 of 230Top 45%
Overall (All Time): #168,182 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12378667 Methods and systems for forming doped silicon nitride films Xingye Wang, Fu Tang, Eric Jen Cheng Liu, YoungChol Byun 2025-08-05
12289157 Two-phase access authentication method integrating spatial-temporal features in space-air-ground integrated networks Bin Yang, Shanyun Liu, Xiangming Zhu, Yinan Qi, Xingming Zhang +3 more 2025-04-29
D983559 Soap dispenser 2023-04-18
11501973 Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures Petri Raisanen, Mark Olstad, Jose Alexandro Romero, Dong Li, Ward Johnson 2022-11-15
11318858 Intelligent electric-vehicle charging station Zhengxian Zheng, Chunlin He, Weifu Wang, Jun Zhu, Yan LI 2022-05-03
11267361 System and method for ordered charging management of charging station Chunlin He, Zhengxian Zheng, Xingping Yan 2022-03-08
10888299 Method and apparatus for x-ray imaging and gain calibration of detector and detector bracket Wei Zhao, Yongtao Tan, Rowland Frederick Saunders 2021-01-12
10872771 Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures Petri Raisanen, Mark Olstad, Jose Alexandro Romero, Dong Li, Ward Johnson 2020-12-22
10217025 Method and apparatus for determining relevance between news and for calculating relevance among multiple pieces of news Shenzheng Zhang, Shaojun Wei 2019-02-26
8372750 Method and system for improved nickel silicide Amitabh Jain, Jorge A. Kittl 2013-02-12
7825025 Method and system for improved nickel silicide Amitabh Jain, Jorge A. Kittl 2010-11-02
7803703 Metal-germanium physical vapor deposition for semiconductor device defect reduction Doufeng Yue, Noel Russell, Douglas E. Mercer 2010-09-28
7511350 Nickel alloy silicide including indium and a method of manufacture therefor Duofeng Yue, Amitabh Jain, Sue Crank, Thomas D. Bonifield, Homi Mogul 2009-03-31
7465626 Method for forming a high-k dielectric stack Tsai Wilman, Mathieu Caymax, Jan Willem Maes 2008-12-16
7435672 Metal-germanium physical vapor deposition for semiconductor device defect reduction Doufeng Yue, Noel Russell, Douglas E. Mercer 2008-10-14
7355255 Nickel silicide including indium and a method of manufacture therefor Duofeng Yue, Amitabh Jain, Sue Crank, Thomas D. Bonifield, Homi Mogul 2008-04-08
7344985 Nickel alloy silicide including indium and a method of manufacture therefor Duofeng Yue, Amitabh Jain, Sue Crank, Thomas D. Bonifield, Homi Mogul 2008-03-18
7211516 Nickel silicide including indium and a method of manufacture therefor Duofeng Yue, Amitabh Jain, Sue Crank, Thomas D. Bonifield, Homi Mogul 2007-05-01
7208398 Metal-halogen physical vapor deposition for semiconductor device defect reduction Duofeng Yue, Douglas E. Mercer, Noel Russell 2007-04-24
7199032 Metal silicide induced lateral excessive encroachment reduction by silicon <110> channel stuffing Duofeng Yue, Sue Crank, Thomas D. Bonifield, Jiong-Ping Lu, Jie Xu 2007-04-03
7132365 Treatment of silicon prior to nickel silicide formation Sue Crank, Shirin Siddiqui, Deborah J. Riley, Trace Hurd 2006-11-07
6143634 Semiconductor process with deuterium predominance at high temperature Robert M. Wallace 2000-11-07
6140243 Low temperature process for post-etch defluoridation of metals Robert M. Wallace, S. Charles Baber, Steven A. Henck 2000-10-31
5286340 Process for controlling silicon etching by atomic hydrogen John T. Yates, Jr., M. Luigi Colaianni 1994-02-15