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On-die parametric test modules for in-line monitoring of context dependent effects |
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SRAM cell with asymmetrical pass gate |
Theodore W. Houston, Shyh-Horng Yang |
2012-07-10 |
| 8211773 |
SRAM cell with asymmetrical pass gate |
Theodore W. Houston, Shyh-Horng Yang |
2012-07-03 |
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Application of different isolation schemes for logic and embedded memory |
Alwin Tsao, Seetharaman Sridhar, Amitava Chatterjee |
2011-11-29 |
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Intentional pocket shadowing to compensate for the effects of cross-diffusion in SRAMs |
Jong Shik Yoon, Amitava Chatterjee, Shaoping Tang |
2010-09-14 |
| 7662688 |
Application of different isolation schemes for logic and embedded memory |
Alwin Tsao, Seetharaman Sridhar, Amitava Chatterjee |
2010-02-16 |
| 7384839 |
SRAM cell with asymmetrical transistors for reduced leakage |
Shyh-Horng Yang, Theodore W. Houston |
2008-06-10 |
| 7341808 |
Method and system for contiguous proximity correction for semiconductor masks |
Theodore W. Houston, Robert Soper, Guohong Zhang |
2008-03-11 |
| 7327591 |
Staggered memory cell array |
Theodore W. Houston |
2008-02-05 |
| 7314800 |
Application of different isolation schemes for logic and embedded memory |
Alwin Tsao, Seetharaman Sridhar, Amitava Chatterjee |
2008-01-01 |
| 7193277 |
Application of different isolation schemes for logic and embedded memory |
Alwin Tsao, Seetharaman Sridhar, Amitava Chatterjee |
2007-03-20 |
| 7141468 |
Application of different isolation schemes for logic and embedded memory |
Alwin Tsao, Seetharaman Sridhar, Amitava Chatterjee |
2006-11-28 |
| 7132340 |
Application of post-pattern resist trim for reducing pocket-shadowing in SRAMs |
Theodore W. Houston |
2006-11-07 |
| 6968528 |
Photo reticles using channel assist features |
Zhijian Lu |
2005-11-22 |
| 6677766 |
Shallow trench isolation step height detection method |
Freidoon Mehrad, Yaojian Leng |
2004-01-13 |