Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8669775 | Scribe line test modules for in-line monitoring of context dependent effects for ICs including MOS devices | Youn Sung Choi, Gregory Charles Baldwin | 2014-03-11 |
| 8664968 | On-die parametric test modules for in-line monitoring of context dependent effects | Gregory Charles Baldwin, Thomas J. Aton, Kayvan Sadra, Youn Sung Choi | 2014-03-04 |
| 8438526 | Method for minimizing transistor and analog component variation in CMOS processes through design rule restrictions | Gregory Charles Baldwin, Younsung Choi | 2013-05-07 |