TL

Tzu-Li Lee

TSMC: 13 patents #2,298 of 12,232Top 20%
TL Tsmc Nanjing Company, Limited: 1 patents #68 of 113Top 65%
📍 Erlun, TW: #7 of 120 inventorsTop 6%
Overall (All Time): #368,385 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
11955441 Interconnect structure and forming method thereof Jian-Hong Lin, Kuo-Yen Liu, Hsin Chang, Yu-Ching Lee, Yih Wang 2024-04-09
11855192 Semiconductor device and manufacturing method thereof Han-Yu Lin, Fang-Wei Lee, Kai Tak Lam, Raghunath PUTIKAM, Tzer-Min Shen +4 more 2023-12-26
11302654 Method of fabricating semiconductor device including dummy via anchored to dummy metal layer Jian-Hong Lin, Kuo-Yen Liu, Hsin Chang, Yu-Ching Lee, Yih Wang 2022-04-12
11222857 Method of forming a photoresist over a bond pad to mitigate bond pad corrosion Chih-Fan Huang, Dian-Hau Chen, Mao-Nan Wang, Yen-Ming Chen, Tzung-Luen Li 2022-01-11
10777510 Semiconductor device including dummy via anchored to dummy metal layer Jian-Hong Lin, Kuo-Yen Liu, Hsin Chang, Yu-Ching Lee, Yih Wang 2020-09-15
8988652 Method and apparatus for ultraviolet (UV) patterning with reduced outgassing Shu-Hao Chang, Tsiao-Chen Wu, Chia-Hao Hsu, Chia-Chen Chen, Ying-Yu Chen +3 more 2015-03-24
8848374 Method and structure for dissipating heat away from a resistor having neighboring devices and interconnects Jian-Hong Lin, Chin Chuan Peng, Bi-Ling Lin, Bor-Jou Wei, Chien Shih Tsai 2014-09-30
8541264 Method for forming semiconductor structure having protection layer for preventing laser damage Jian-Hong Lin, Kang-Cheng Lin 2013-09-24
8354346 Method for fabricating low-k dielectric and Cu interconnect Chih-Hao Chen, Chia-Cheng Chou, Ming-Chung Liang, Keng-Chu Lin 2013-01-15
8242576 Protection layer for preventing laser damage on semiconductor devices Jian-Hong Lin, Kang-Cheng Lin 2012-08-14
8212330 Process for improving the reliability of interconnect structures and resulting structure Hsien-Wei Chen, Jian-Hong Lin 2012-07-03
7998873 Method for fabricating low-k dielectric and Cu interconnect Chih-Hao Chen, Chia-Cheng Chou, Ming-Chung Liang, Keng-Chu Lin 2011-08-16
7816256 Process for improving the reliability of interconnect structures and resulting structure Hsien-Wei Chen, Jian-Hong Lin 2010-10-19