Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11901289 | Semiconductor device structure with resistive element | Wan-Te Chen, Chung-Hui Chen, Wei-Chih Chen, Chii-Ping Chen, Wen-Sheh Huang +1 more | 2024-02-13 |
| 11404369 | Semiconductor device structure with resistive element | Wan-Te Chen, Chung-Hui Chen, Wei-Chih Chen, Chii-Ping Chen, Wen-Sheh Huang +1 more | 2022-08-02 |
| 10978440 | Circuit layout method | Shou-En Liu, Chun-Wei Chang, Yung-Sheng Tsai, Jiaw-Ren Shih | 2021-04-13 |
| 10403621 | Circuit layout, layout method and system for implementing the method | Shou-En Liu, Chun-Wei Chang, Yung-Sheng Tsai, Jiaw-Ren Shih | 2019-09-03 |
| 10304772 | Semiconductor device structure with resistive element | Wan-Te Chen, Chung-Hui Chen, Wei-Chih Chen, Chii-Ping Chen, Wen-Sheh Huang +1 more | 2019-05-28 |
| 9875964 | Semiconductor device components and methods | Jian-Hong Lin, Ming-Hong Hsieh, Lee-Der Chen, Jiaw-Ren Shih, Chwei-Ching Chiu | 2018-01-23 |
| 8848374 | Method and structure for dissipating heat away from a resistor having neighboring devices and interconnects | Jian-Hong Lin, Chin Chuan Peng, Tzu-Li Lee, Bor-Jou Wei, Chien Shih Tsai | 2014-09-30 |
| 8648592 | Semiconductor device components and methods | Jian-Hong Lin, Ming-Hong Hsieh, Lee-Der Chen, Jiaw-Ren Shih, Chwei-Ching Chiu | 2014-02-11 |
| 7646207 | Method for measuring a property of interconnections and structure for the same | Jian-Hong Lin, Chin Chuan Peng, Shou-Chung Lee, Chien-Jung Wang, Chien Shih Tsai +1 more | 2010-01-12 |
| 6548363 | Method to reduce the gate induced drain leakage current in CMOS devices | Chung-Cheng Wu, Carlos H. Diaz | 2003-04-15 |
| 6284579 | Drain leakage reduction by indium transient enchanced diffusion (TED) for low power applications | Jyh-Haur Wang, Chung-Cheng Wu, Carlos H. Diaz | 2001-09-04 |
| 6100150 | Process to improve temperature uniformity during RTA by deposition of in situ poly on the wafer backside | Jiaw-Ren Shih, Huey-Liang Hwang | 2000-08-08 |