Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9929254 | Method of manufacturing semiconductor device | Wei-Yang Lo, Shih-Hao Chen, Tung-Wen Cheng | 2018-03-27 |
| 9882013 | Semiconductor device and manufacturing method thereof | Jung-Wang Lu, Kuo-Hui Chang | 2018-01-30 |
| 9812577 | Semiconductor structure and fabricating method thereof | Che-Cheng Chang, Tung-Wen Cheng, Chang-Yin Chen | 2017-11-07 |
| 9799771 | FinFET and method for manufacturing the same | Tung-Wen Cheng, Che-Cheng Chang, Zhe Zhang | 2017-10-24 |
| 9735256 | Method and structure for FinFET comprising patterned oxide and dielectric layer under spacer features | Che-Cheng Chang, Chih-Han Lin, Jr-Jung Lin, Shih-Hao Chen, Yung-Jung Chang | 2017-08-15 |
| 9646871 | Semiconductor structure with shallow trench isolation and manufacturing method thereof | Che-Cheng Chang, Tung-Wen Cheng, Jui Fu Hseih | 2017-05-09 |
| 9627512 | Field effect transistor with non-doped channel | Tung-Wen Cheng, Chang-Yin Chen, Che-Cheng Chang | 2017-04-18 |
| 9559165 | Semiconductor structure with strained source and drain structures and method for forming the same | Tung-Wen Cheng, Chang-Yin Chen, Che-Cheng Chang | 2017-01-31 |
| 9559207 | Semiconductor device having epitaxy structure | Wei-Yang Lo, Shih-Hao Chen, Tung-Wen Cheng | 2017-01-31 |
| 7254513 | Fault detection and classification (FDC) specification management apparatus and method thereof | Yi-Yu Wu, Chia-Hung Chung, Jian-Hong Chen, Chon-Hwa Chu, Ie-Fun Lai +1 more | 2007-08-07 |
| 7117058 | Automatic statistical process control (SPC) chart generation apparatus and method thereof | Tien-Wen Wang, Joseph Weizhou Fang, Ie-Fun Lai, Chon-Hwa Chu, Jian-Hong Chen +4 more | 2006-10-03 |
| 6980876 | Temperature-sensing wafer position detection system and method | Kong-Hsin Teng, Tien-Wen Wang, Jen-Hom Chen | 2005-12-27 |
| 6920891 | Exhaust adaptor and method for chamber de-gassing | Wie-Liang Tsai, Cherng-Chang Lee, Yen-Chan Lee, Chia-Hsin Liu | 2005-07-26 |
| 6778875 | Noise filter for backside helium signal | Zhih-Lu Juang, Tung-Mao Lee | 2004-08-17 |
| 6733617 | Direct detection of dielectric etch system magnet driver and coil malfunctions | Tse-Lun Chang, Sen-Tay Chang, Yao-Ping Yang | 2004-05-11 |
| 6595370 | Apparatus and method for reducing contamination in a wafer transfer chamber | Yu-Lun Lin, Yao-Fey Chuang | 2003-07-22 |
| 6444587 | Plasma etch method incorporating inert gas purge | Pin-Yi Hsin | 2002-09-03 |