Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7254513 | Fault detection and classification (FDC) specification management apparatus and method thereof | Mu-Tsang Lin, Yi-Yu Wu, Chia-Hung Chung, Jian-Hong Chen, Chon-Hwa Chu +1 more | 2007-08-07 |
| 7117058 | Automatic statistical process control (SPC) chart generation apparatus and method thereof | Mu-Tsang Lin, Tien-Wen Wang, Joseph Weizhou Fang, Chon-Hwa Chu, Jian-Hong Chen +4 more | 2006-10-03 |