YC

Yung-Jung Chang

TSMC: 55 patents #588 of 12,232Top 5%
IT ITRI: 2 patents #3,461 of 9,619Top 40%
📍 Zhumaoya, TW: #7 of 25 inventorsTop 30%
Overall (All Time): #42,313 of 4,157,543Top 2%
57
Patents All Time

Issued Patents All Time

Showing 1–25 of 57 patents

Patent #TitleCo-InventorsDate
12211750 Mechanisms for forming FinFET device Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin 2025-01-28
12051752 Embedded source or drain region of transistor with downward tapered region under facet region Che-Cheng Chang, Tung-Wen Cheng, Zhe Zhang 2024-07-30
11721746 Method and structure for FinFET comprising patterned oxide and dielectric layer under spacer features Che-Cheng Chang, Jr-Jung Lin, Shih-Hao Chen, Chih-Han Lin, Mu-Tsang Lin 2023-08-08
11721762 Fin field effect transistor (FinFET) device and method for forming the same Zhe Zhang, Tung-Wen Cheng, Che-Cheng Chang, Chang-Yin Chen 2023-08-08
11669957 Semiconductor wafer measurement method and system Peng Chen, Yi-An Huang, Jyun-Hong Chen, Wei-Chung Hu, Wen-Hao Cheng +1 more 2023-06-06
11594635 Embedded source or drain region of transistor with downward tapered region under facet region Che-Cheng Chang, Tung-Wen Cheng, Zhe Zhang 2023-02-28
11380590 Mechanisms for forming FinFET device Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin 2022-07-05
11257931 Gate structure of field effect transistor with footing Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin 2022-02-22
11158744 Fin field effect transistor (FinFET) device and method for forming the same Zhe Zhang, Tung-Wen Cheng, Chang-Yin Chen, Che-Cheng Chang 2021-10-26
11094057 Semiconductor wafer measurement method and system Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Wei-Chung Hu, Yi-An Huang +1 more 2021-08-17
10964819 Fin field effect transistor (FinFET) device and method for forming the same Zhe Zhang, Tung-Wen Cheng, Che-Cheng Chang 2021-03-30
10879372 Semiconductor device with a metal gate stack having tapered sidewalls Che-Cheng Chang, Yi-Jen Chen, Chang-Yin Chen 2020-12-29
10868187 Method of forming embedded source or drain region of transistor with laterally extended portion Che-Cheng Chang, Chang-Yin Chen 2020-12-15
10861954 High-K film apparatus and method Che-Cheng Chang, Yi-Ren Chen, Chang-Yin Chen, Yi-Jen Chen, Ming Zhu +1 more 2020-12-08
10854504 Semiconductor structure and manufacturing method thereof Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin 2020-12-01
10840378 Fin field effect transistor (FinFET) device and method for forming the same Zhe Zhang, Tung-Wen Cheng, Chang-Yin Chen, Che-Cheng Chang 2020-11-17
10804396 Embedded source or drain region of transistor with downward tapered region under facet region Che-Cheng Chang, Tung-Wen Cheng, Zhe Zhang 2020-10-13
10762621 Semiconductor wafer measurement method and system Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Wei-Chung Hu, Yi-An Huang +1 more 2020-09-01
10749014 Method and structure for FinFET comprising patterned oxide and dielectric layer under spacer features Che-Cheng Chang, Jr-Jung Lin, Shih-Hao Chen, Chih-Han Lin, Mu-Tsang Lin 2020-08-18
10686077 Fin field effect transistor (FinFET) device and method for forming the same Zhe Zhang, Tung-Wen Cheng, Chang-Yin Chen, Che-Cheng Chang 2020-06-16
10672796 Mechanisms for forming FINFET device Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin 2020-06-02
10547796 Calibration equipment and calibration method of a mechanical system Jyun-Ji Wang, Jwu-Sheng Hu 2020-01-28
10546956 Fin field effect transistor (FinFET) device and method for forming the same Zhe Zhang, Tung-Wen Cheng, Che-Cheng Chang 2020-01-28
10535758 Gate structure of field effect transistor with footing Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin 2020-01-14
10367079 Method and structure for FinFET comprising patterned oxide and dielectric layer under spacer features Che-Cheng Chang, Jr-Jung Lin, Shih-Hao Chen, Chih-Han Lin, Mu-Tsang Lin 2019-07-30