Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400987 | Semiconductor device | Ming-Ho Tsai, Chun-Chen Liu, Yu-Nu Hsu, Peng Chen, Wen-Hao Cheng +1 more | 2025-08-26 |
| 12374572 | Systems and methods for systematic physical failure analysis (PFA) fault localization | Peng Chen, Wen-Hao Cheng, Chien-Hui Chen | 2025-07-29 |
| 12027396 | Systems and methods for systematic physical failure analysis (PFA) fault localization | Peng Chen, Wen-Hao Cheng, Chien-Hui Chen | 2024-07-02 |
| 12021050 | Semiconductor device | Ming-Ho Tsai, Chun-Chen Liu, Yu-Nu Hsu, Peng Chen, Wen-Hao Cheng +1 more | 2024-06-25 |
| 11681851 | Hierarchical density uniformization for semiconductor feature surface planarization | Venkata Sripathi Sasanka Pratapa, Wen-Hao Cheng | 2023-06-20 |
| 11669957 | Semiconductor wafer measurement method and system | Peng Chen, Yi-An Huang, Wei-Chung Hu, Wen-Hao Cheng, Shiang-Bau Wang +1 more | 2023-06-06 |
| 11600505 | Systems and methods for systematic physical failure analysis (PFA) fault localization | Peng Chen, Wen-Hao Cheng, Chien-Hui Chen | 2023-03-07 |
| 11469198 | Semiconductor device manufacturing method and associated semiconductor die | Ming-Ho Tsai, Chun-Chen Liu, Yu-Nu Hsu, Peng Chen, Wen-Hao Cheng +1 more | 2022-10-11 |
| 11182532 | Hierarchical density uniformization for semiconductor feature surface planarization | Venkata Sripathi Sasanka Pratapa, Wen-Hao Cheng | 2021-11-23 |
| 11094057 | Semiconductor wafer measurement method and system | Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Yung-Jung Chang, Wei-Chung Hu +1 more | 2021-08-17 |
| 10762621 | Semiconductor wafer measurement method and system | Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Yung-Jung Chang, Wei-Chung Hu +1 more | 2020-09-01 |
| 10538486 | Hydroxamic acid type contrast agent containing radioisotope fluoride, preparation method and application thereof | Mei-Hui Wang, Chia-Yu Hu, Mao-Chi Weng, Chun-Hung Yang, Hung-Man Yu | 2020-01-21 |
| 10304178 | Method and system for diagnosing a semiconductor wafer | Peng Chen, Shiang-Bau Wang, Wen-Hao Cheng, Yung-Jung Chang, Wei-Chung Hu +1 more | 2019-05-28 |
| 9981050 | Bispecific peptide conjugate and radioactive bispecific peptide imaging agent | Hung-Man Yu, Kun-Liang Lin, Chien-Jen Chen, Wuu-Jyh Lin | 2018-05-29 |
| 9230867 | Structure and method for E-beam in-chip overlay mark | Dong-Hsu Cheng, Ming-Ho Tsai, Chih-Chung Huang, Yung-Hsiang Chen | 2016-01-05 |
| 8736084 | Structure and method for E-beam in-chip overlay mark | Dong-Hsu Cheng, Ming-Ho Tsai, Chih-Chung Huang, Yung-Hsiang Chen | 2014-05-27 |
| 7399881 | Transesterification process of methyl acetate | Hsiao-Ping Huang, Cheng-Ching Yu, Ming-Jer Lee, Jian-Kai Cheng | 2008-07-15 |