Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11681851 | Hierarchical density uniformization for semiconductor feature surface planarization | Jyun-Hong Chen, Wen-Hao Cheng | 2023-06-20 |
| 11182532 | Hierarchical density uniformization for semiconductor feature surface planarization | Jyun-Hong Chen, Wen-Hao Cheng | 2021-11-23 |
| 10734294 | System and method for measuring and improving overlay using electronic microscopic imaging and digital processing | Cheng-Ming Ho, Po Shun Lin, Yi-Ju Wang | 2020-08-04 |
| 10424519 | System and method for measuring and improving overlay using electronic microscopic imaging and digital processing | Cheng-Ming Ho, Po Shun Lin, Yi-Ju Wang | 2019-09-24 |
| 9793183 | System and method for measuring and improving overlay using electronic microscopic imaging and digital processing | Cheng-Ming Ho, Po Shun Lin, Yi-Ju Wang | 2017-10-17 |