DL

Da-Wen Lin

TSMC: 63 patents #490 of 12,232Top 5%
Overall (All Time): #35,039 of 4,157,543Top 1%
63
Patents All Time

Issued Patents All Time

Showing 51–63 of 63 patents

Patent #TitleCo-InventorsDate
8283734 Multi-threshold voltage device and method of making same Chung-Yu Chiang, Shyh-Wei Wang 2012-10-09
8278179 LDD epitaxy for FinFETs Che-Min Chu, Tsung-Hung Li, Chih-Hung Tseng, Yen-Chun Lin, Chung-Cheng Wu 2012-10-02
8278196 High surface dopant concentration semiconductor device and method of fabricating Yu-Lien Huang, Mao-Rong Yeh, Chun Hsiung Tsai, Tsung-Hung Lee, Tsz-Mei Kwok 2012-10-02
8143680 Gated diode with non-planar source region Ying-Shiou Lin, Shyh-Wei Wang, Li-Ping Huang, Ying-Keung Leung, Carlos H. Diaz 2012-03-27
7994016 Method for obtaining quality ultra-shallow doped regions and device having same Chun Hsiung Tsai, Chun-Feng Nieh, Chien-Tai Chan 2011-08-09
7795119 Flash anneal for a PAI, NiSi process Chia Ping Lo, Jerry Lai, Chii-Ming Wu, Mei-Yun Wang 2010-09-14
7732877 Gated diode with non-planar source region Ying-Shiou Lin, Shyh-Wei Wang, Li-Ping Huang, Ying-Keung Leung, Carlos H. Diaz 2010-06-08
7399679 Narrow width effect improvement with photoresist plug process and STI corner ion implantation Yi-Ming Sheu, Cheng-Ku Chen, Po-Ying Yeh, Shi-Shung Peng, Chung-Cheng Wu 2008-07-15
7115974 Silicon oxycarbide and silicon carbonitride based materials for MOS devices Zhen-Cheng Wu, Hung Chun Tsai, Weng Chang, Shwang-Ming Cheng, Mong-Song Liang 2006-10-03
7071515 Narrow width effect improvement with photoresist plug process and STI corner ion implantation Yi-Ming Sheu, Cheng-Ku Chen, Po-Ying Yeh, Shi-Shung Peng, Chung-Cheng Wu 2006-07-04
7012014 Recessed gate structure with reduced current leakage and overlap capacitance Yi-Ming Sheu, Ying-Keung Leung 2006-03-14
6673683 Damascene gate electrode method for fabricating field effect transistor (FET) device with ion implanted lightly doped extension regions Yi-Ming Sheu, Yi-Ling Chan, Wan-Yih Lien, Carlos H. Diaz 2004-01-06
6670226 Planarizing method for fabricating gate electrodes Yo-Sheng Lin, Yi-Ming Sheu, Chi-Hsun Hsieh 2003-12-30