CW

Chii-Ming Wu

TSMC: 104 patents #249 of 12,232Top 3%
Overall (All Time): #13,030 of 4,157,543Top 1%
105
Patents All Time

Issued Patents All Time

Showing 26–50 of 105 patents

Patent #TitleCo-InventorsDate
11322464 Film structure for bond pad Julie Yang, Tzu-Chung Tsai, Yao-Wen Chang 2022-05-03
11309491 Data storage structure for improving memory cell reliability Hai-Dang Trinh, Cheng-Yuan Tsai, Tzu-Chung Tsai, Fa-Shen Jiang 2022-04-19
11271114 Strained gate semiconductor device with oxygen-doped interlayer dielectric material Cheng-Ta Wu, Shiu-Ko JangJian, Kun-Tzu Lin, Lan Chang 2022-03-08
11257997 Semiconductor structure Chia-Hua Lin, Yao-Wen Chang, Cheng-Yuan Tsai, Eugene Chen, Tzu-Chung Tsai 2022-02-22
11152455 Method to reduce breakdown failure in a MIM capacitor Hsing-Lien Lin, Chia-Shiung Tsai, Chung-Yi Yu, Rei-Lin Chu 2021-10-19
11152568 Top-electrode barrier layer for RRAM Hsing-Lien Lin, Fa-Shen Jiang 2021-10-19
11131025 Wireless camera wafer for vacuum chamber diagnostics Tzu-Chung Tsai, Hai-Dang Trinh 2021-09-28
11094583 Method of forming a device having a doping layer and device formed Cheng-Ta Wu 2021-08-17
11081563 Formation of silicide contacts in semiconductor devices Yan-Ming Tsai, Wei-Jung Lin, Fang Chen 2021-08-03
10950490 Semiconductor device having isolation structures with different thicknesses Cheng-Ta Wu, Sen-Hong Syue, Cheng-Po Chau 2021-03-16
10910560 RRAM structure Hai-Dang Trinh, Hsing-Lien Lin, Fa-Shen Jiang 2021-02-02
10879354 Semiconductor device and forming method thereof Cheng-Ta Wu 2020-12-29
10868247 Semiconductor device structure with multiple resistance variable layers Hai-Dang Trinh, Hsing-Lien Lin, Cheng-Yuan Tsai 2020-12-15
10818544 Method to enhance electrode adhesion stability Hsing-Lien Lin, Hai-Dang Trinh, Fa-Shen Jiang 2020-10-27
10748798 Wireless camera wafer for vacuum chamber diagnostics Tzu-Chung Tsai, Hai-Dang Trinh 2020-08-18
10672909 Strained gate semiconductor device having an interlayer dielectric doped with oxygen and a large species material Cheng-Ta Wu, Shiu-Ko JangJian, Kun-Tzu Lin, Lan Chang 2020-06-02
10658581 Semiconductor device structure with multiple resistance variable layers Hai-Dang Trinh, Hsing-Lien Lin, Cheng-Yuan Tsai 2020-05-19
10535568 Method for manufacturing multi-voltage devices using high-K-metal-gate (HKMG) technology Chun-Han Tsao, Cheng-Yuan Tsai, Yi-Huan Chen 2020-01-14
10177043 Method for manufacturing multi-voltage devices using high-K-metal-gate (HKMG) technology Chun-Han Tsao, Cheng-Yuan Tsai, Yi-Huan Chen 2019-01-08
10157780 Method of forming a device having a doping layer and device formed Cheng-Ta Wu 2018-12-18
10157770 Semiconductor device having isolation structures with different thickness and method of forming the same Cheng-Ta Wu, Sen-Hong Syue, Cheng-Po Chau 2018-12-18
10128115 Method of forming ultra-shallow junctions in semiconductor devices Chun-Feng Nieh, Mao-Rong Yeh, Chun Hsiung Tsai 2018-11-13
10020401 Methods for straining a transistor gate through interlayer dielectric (ILD) doping schemes Cheng-Ta Wu, Shiu-Ko JangJian, Kun-Tzu Lin, Lan Chang 2018-07-10
9997633 Semiconductor devices, FinFET devices and methods of forming the same Ru-Shang Hsiao 2018-06-12
9929268 Fin field effect transistor and method for fabricating the same Ru-Shang Hsiao, Hung-Pin Chen, Sen-Hong Syue, Chi-Cherng Jeng 2018-03-27